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  to our customers, old company name in catalogs and other documents on april 1 st , 2010, nec electronics corporation merged with renesas technology corporation, and renesas electronics corporation took over all the business of both companies. therefore, although the old company name remains in this document, it is a valid renesas electronics document. we appreciate your understanding. renesas electronics website: http://www.renesas.com april 1 st , 2010 renesas electronics corporation issued by: renesas electronics corporation ( http://www.renesas.com ) send any inquiries to http://www.renesas.com/inquiry .
notice 1. all information included in this document is current as of th e date this document is issued. such information, however, is subject to change without any prior notice. before purchasing or using any renesas electronics products listed herein, please confirm the latest product information with a renesas electronics sales office. also, please pay regular and careful attention to additional and different information to be disclosed by renesas electronics such as that disclosed through our website. 2. renesas electronics does not assume any liability for infringement of patents, copyrights, or other intellectual property ri ghts of third parties by or arising from the use of renesas electronics products or technical information described in this document . no license, express, implied or otherwise, is granted hereby under any patents, copyrights or other intellectual property right s of renesas electronics or others. 3. you should not alter, modify, copy, or otherwise misappropriate any renesas electronics product, whether in whole or in part . 4. descriptions of circuits, software and other related information in this document are provided only to illustrate the operat ion of semiconductor products and application examples. you are fully responsible for the incorporation of these circuits, software, and information in the design of your equipment. renesas electronics assumes no responsibility for any losses incurred by you or third parties arising from the use of these circuits, software, or information. 5. when exporting the products or technology described in this document, you should comply with the applicable export control laws and regulations and follow the procedures required by such laws and regulations. you should not use renesas electronics products or the technology de scribed in this document for any purpose re lating to military applications or use by the military, including but not limited to the development of weapons of mass destruction. renesas electronics products and technology may not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any applicable domestic or foreign laws or regulations. 6. renesas electronics has used reasonable care in preparing the information included in this document, but renesas electronics does not warrant that such information is error free. renesas electronics assumes no liability whatsoever for any damages incurred by you resulting from errors in or om issions from the information included herein. 7. renesas electronics products are classified according to the following three quality grades: ?standard?, ?high quality?, an d ?specific?. the recommended applications for each renesas electronics product depends on the product?s quality grade, as indicated below. you must check the quality grade of each renesas electronics product before using it in a particular application. you may not use any renesas electronics product for any application categorized as ?specific? without the prior written consent of renesas electronics. further, you may not use any renesas electronics product for any application for which it is not intended without the prior written consent of renesas electronics. renesas electronics shall not be in any way liable for any damages or losses incurred by you or third parties arising from the use of any renesas electronics product for a n application categorized as ?specific? or for which the product is not intended where you have failed to obtain the prior writte n consent of renesas electronics. the quality grade of each renesas electronics product is ?standard? unless otherwise expressly specified in a renesas electronics data sheets or data books, etc. ?standard?: computers; office equipment; communications equipment; test and measurement equipment; audio and visual equipment; home electronic appliances; machine tools; personal electronic equipment; and industrial robots. ?high quality?: transportation equipment (automobiles, trains, ship s, etc.); traffic control systems; anti-disaster systems; an ti- crime systems; safety equipment; and medical equipment not specifically designed for life support. ?specific?: aircraft; aerospace equipment; submersible repeaters; nuclear reactor control systems; medical equipment or systems for life support (e.g. artificial life support devices or systems), surgical implantations, or healthcare intervention (e.g. excision, etc.), and any other applications or purposes that pose a direct threat to human life. 8. you should use the renesas electronics products described in this document within the range specified by renesas electronics , especially with respect to the maximum rating, operating supply voltage range, movement power voltage range, heat radiation characteristics, installation and other product characteristics. renesas electronics shall have no liability for malfunctions o r damages arising out of the use of renesas electronics products beyond such specified ranges. 9. although renesas electronics endeavors to improve the quality and reliability of its products, semiconductor products have specific characteristics such as the occurrence of failure at a certain rate and malfunctions under certain use conditions. fur ther, renesas electronics products are not subject to radiation resistance design. please be sure to implement safety measures to guard them against the possibility of physical injury, and injury or damage caused by fire in the event of the failure of a renesas electronics product, such as safety design for hardware and software including but not limited to redundancy, fire control and malfunction prevention, appropriate treatment for aging degradation or any other appropriate measures. because the evaluation of microcomputer software alone is very difficult, please evaluate the safety of the final products or system manufactured by you. 10. please contact a renesas electronics sales office for details as to environmental matters such as the environmental compatibility of each renesas electronics product. please use re nesas electronics products in compliance with all applicable laws and regulations that regulate the inclusion or use of c ontrolled substances, including without limitation, the eu rohs directive. renesas electronics assumes no liability for damages or losses occurring as a result of your noncompliance with applicable laws and regulations. 11. this document may not be reproduced or duplicated, in any fo rm, in whole or in part, without prior written consent of renes as electronics. 12. please contact a renesas electronics sales office if you have any questions regarding the information contained in this document or renesas electronics products, or if you have any other inquiries. (note 1) ?renesas electronics? as used in this document means renesas electronics corporation and also includes its majority- owned subsidiaries. (note 2) ?renesas electronics product(s)? means any product developed or manufactured by or for renesas electronics.
r1ex25032asa00a/r1ex25064asa00a r1ex25032ata00a/r1ex25064ata00a serial peripheral interface 32k eeprom (4-kword 8-bit) 64k eeprom (8-kword 8-bit) electrically erasable and progr ammable read only memory rej03c0358-0002 preliminary rev.0.02 jan.14.2009 description r1ex25xxx series is the serial peripheral interface co m p atible (spi) eeprom (electrically erasable and pro g r am m a b l e rom). it realizes h i g h sp eed , lo w p o w er co n s u m p tio n an d a h i g h lev e l o f reliab ility b y em p l o y in g advanced m onos m e m o ry t echnol ogy and cm os process and l o w vol t a ge ci rcui t r y t echnol ogy . it al so has a 32-by t e page program m i ng funct i on t o m a ke i t ? s wri t e operat i on fast er. not e : r e nesas technol ogy ?s seri al eepr o m are aut hori zed fo r usi ng consum er appl i cat i ons such as cel l u l a r phones, cam corders, audi o equi pm ent s . therefore, pl ease c ont act r e nesas technol ogy ?s sal e s offi ce before usi ng i ndust r i a l appl i cat i ons such as aut o m o t i v e sy st em s, em bedded cont rol l e rs, and m e t e rs. features ? si ngl e suppl y : 1.8 v t o 5.5 v ? serial peripheral interface com p atible (spi bus) ? spi m ode 0 (0,0), 3 (1,1) ? c l ock frequency : 5 m h z (2.5 v t o 5.5 v), 3 m h z (1.8 v t o 5.5 v) ? power di ssi pat i on: ? st andby : 2 a (m ax) ? active (read): 3.0 m a (m ax) ? active (w rite): 3.5 m a (m ax) ? au to m a tic p a g e write: 3 2 - b y te/p ag e ? w r ite cycle tim e: 5 m s ? endurance: 1,000k c y cl es @25 c ? dat a ret e nt i on: 100 years @25 c ? sm all size packages: sop-8pin, tssop-8pin ? shi ppi ng t a pe and reel ? tssop-8pi n : 3,000 ic / r eel ? sop-8pi n : 2,500 ic / r eel ? tem p erature range: ? 40 t o + 85 c ? lead free product . rej03c0358-0002.rev.0. 02 jan.14.2009 page 1 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 ordering information t y p e no . in tern al o r g a n i zatio n op eratin g v o ltag e f r eq u e n c y packag e r1ex 25032asa00a 32-kbit (4096 8-pin sop/tssop (t op view) 1 2 3 4 8 7 6 5 v cc hold c d s q w v ss pin description pin na me func tion c s e r i a l c l o c k d serial data input q serial data output s chip select w w r ite protect hold hold v cc s u p p l y v o l t a g e v ss g r o u n d page 2 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 block diagram high voltage generator memory array y -select & sense amp. serial-parallel converter address generator control logic y decoder x decoder v cc v ss s w c hold d q absolute maximum ratings p a r a m e t e r s y m b o l v a l u e u n i t supply voltage relative to v ss v cc ? 0.6 to + 7.0 v input voltage relative to v ss v in ? 0.5 * 2 to +7.0 * 3 v operating tem perature range * 1 t o p r ? 40 to + 85 c storage temperature range t s tg ? 55 to + 125 c notes: 1. including electrical c haracteristics and data retention. 2. v in (min): ? 3.0 v for pulse w i dth  50 ns. 3. should not exceed v cc + 1.0 v. dc operating conditions pa ra me te r s y m b o l m i n ty p ma x u n i t supply voltage v cc 1 . 8  5 . 5 v v ss 0 0 0 v input voltage v ih v cc 0.7  v cc + 0.5 * 2 v v il ? 0.3 * 1  v cc 0.3 v operating temper ature range t opr ? 40  + 85 c notes: 1. v in (min): ? 1.0 v for pulse w i dth  50 ns. 2. v in (max ) : v cc + 1.0 v for pulse w i dth  50 ns. capacitance (ta = +25 c, f = 1 mhz ) parameter sy mbol min ty p max unit t est c onditions input capacitance (d,c, s , w ,hold ) c i n * 1   6.0 pf vin = 0 v output capacitance (q) c i/o * 1   8.0 pf vout = 0 v note: 1. not 100 % tested. memory cell characteristics (v cc = 1.8 v to 5.5 v) t a =2 5 c t a =8 5 c n o t e s endurance 1,000k cy cles min. 100k cy cles min 1 data retention 100 years min. 10 years min. 1 notes: 1. not 100 % tested page 3 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 dc characteristics parameter sy m b o l m i n ma x u n i t te s t c onditions input leakage current i li ? 2 a v cc = 5.5 v, v in = 0 to 5.5 v ( s , d, c, hold , w ) output leakage current i lo ? 2 a v cc = 5.5 v, v out = 0 to 5.5 v (q) v cc current standby i sb ? 2 a v in = v ss or v cc , v cc = 5.5 v a c t i v e i cc1 ? 2 m a v cc = 3.6 v, read at 5 mhz v in = v cc 0.1/v cc 0.9 q = open ? 3 m a v cc = 5.5 v, read at 5 mhz v in = v cc 0.1/v cc 0.9 q = open i cc2 ? 2 m a v cc = 3.6 v, w r ite at 5 mhz v in = v cc 0.1/v cc 0.9 ? 3 . 5 m a v cc = 5.5 v, w r ite at 5 mhz v in = v cc 0.1/v cc 0.9 output voltage v ol1 ? 0 . 4 v v cc = 5.5 v, i ol = 2 ma v ol2 ? 0 . 4 v v cc = 2.5 v, i ol = 1.5 ma v oh1 v cc 0.8 ? v v cc = 5.5 v, i oh = ? 2 ma v oh2 v cc 0.8 ? v v cc = 2.5 v, i oh = ? 0.4 ma page 4 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 ac characteristics test conditions ? ? ? ? ? ? ? ? + p a r a m e t e r s y m b o l a l t m i n m a x u n i t n o t e s clock frequency f c f sc k ? s active setup time t slc h t c ss1 9 0 ? s not active setup time t s hch t c ss2 9 0 ? s deselect time t sh sl t cs 9 0 ? s active hold time t chs h t cs h 9 0 ? s not active hold time t chs l ? ? ? ? ? ? ? ? hold not active t hhch ? ? hold active t hl ch ? ? hold active t chhl ? ? hold not active t chhh ? ? ? ? ? ? ? hold high to output low - z t hhqx t lz ? hold low to output high-z t hl qz t hz ? ? + %
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 (ta = ? + p a r a m e t e r s y m b o l a l t m i n m a x u n i t n o t e s clock frequency f c f sc k ? 3 m h z s active setup time t slc h t c ss1 1 0 0 ? n s s not active setup time t s hch t c ss2 1 0 0 ? n s s deselect time t sh sl t cs 1 5 0 ? n s s active hold time t chs h t cs h 1 0 0 ? n s s not active hold time t chs l ? 1 0 0 ? n s clock high time t ch t cl h 1 5 0 ? n s 1 clock low time t cl t cl l 1 5 0 ? n s 1 clock rise time t cl ch t rc ? 1 s 2 clock fall time t chcl t fc ? 1 s 2 data in setup time t dv ch t ds u 3 0 ? n s data in hold time t chdx t dh 5 0 ? n s clock low hold time after hold not active t hhch ? 1 4 0 ? n s clock low hold time after hold active t hl ch ? 9 0 ? n s clock high setup time before hold active t chhl ? 1 2 0 ? n s clock high setup time before hold not active t chhh ? 1 2 0 ? n s output disable time t sh qz t dis ? 2 0 0 n s 2 clock low to output valid t cl qv t v ? 1 2 0 n s output hold time t cl qx t ho 0 ? n s output rise time t qlqh t ro ? 1 0 0 n s 2 output fall time t qhql t fo ? 1 0 0 n s 2 hold high to output low - z t hhqx t lz ? 1 0 0 n s 2 hold low to output high-z t hl qz t hz ? 1 0 0 n s 2 write time t w t wc ? 5 m s notes: 1. t ch + t cl 1/f c 2. not 100 % tested. page 6 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 timing waveforms serial input timing s c t chsl t slch t chdx t clch t chcl t shch t chsh t shsl t dvch msb in lsb in d q high impedance hold timing t chhl s hold c d q t hlch t chhh t hlqz t hhqx t hhch output timing s c d q lsb out addr lsb in t qlqh t qhql t shqz t ch t cl t clqv t clqx t clqv t clqx page 7 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 pin function serial data output (q) thi s out put si gnal i s used t o t r ansfer dat a seri al l y out of t h e devi ce. dat a i s shi f t e d out on t h e fal l i ng edge of seri al cl ock (c ). serial data input (d) this input signal is used to transfer data serially into the device. it receives in structions, addresses, and the data to be written . valu es are latch e d o n th e risin g ed g e o f serial clo c k (c). serial clock (c) this input signal provides the tim ing of the serial interface. instructions, addresses, or data present at serial data input (d) are l a t c hed on t h e ri si ng edge of seri al cl ock (c ). dat a on seri al dat a out put (q) changes aft e r t h e fal l i ng edge of serial clock (c). chip select ( s ) w h en t h i s i nput si gnal i s hi gh, t h e devi ce i s desel ect ed and seri al dat a out put (q) i s at hi gh i m pedance. unl e ss an internal write cycle is in progre ss, the device will be in the standby m ode. driving chip select ( s ) lo w en ab les th e devi ce, pl aci ng i t i n t h e act i v e power m ode. aft e r power-up, a fal l i ng edge on chi p sel ect ( s ) is required prior to the start o f an y in stru ctio n . hold ( hold ) the hol d ( hold ) si gnal i s used t o pause any seri al com m uni cat i ons wi t h t h e devi ce wi t hout desel ect i ng t h e devi ce. duri ng t h e hol d condi t i on, t h e seri al dat a out put (q) i s hi gh i m pedance, and seri al dat a i nput (d) and seri al cl ock (c ) are don?t care. to start the hold condition, the device m u st be selected, with chip select ( s ) d r iv en lo w. write protect ( w ) the m a in purpose of this input signal is to freeze the size of the area of m e m o ry that is protected against write i n st ruct i ons (as speci fi ed by t h e val u es i n t h e b p 1 and b p 0 bi t s of t h e st at us regi st er). thi s pi n m u st be dri v en ei t h er hi gh or l o w, and m u st be st abl e duri ng al l wri t e operat i ons. page 8 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 functional description status register the fol l o wi ng fi gure shows t h e st at us r e gi st er form at . the st at us r e gi st er cont ai ns a num ber of st at us and cont rol bi t s t h at can be read or set (as appropri a t e ) by speci fi c i n st ruct i ons. status register format srwd 0 0 0 bp1 bp0 wel wip b7 status register write disable block protect bits write enable latch bits write in progress bits b0 w i p b it: th e w r ite in pro g r ess (w ip) b it in d i cates wh eth e r th e m e m o ry is b u s y with a w r ite o r w r ite statu s reg i ster cycle. w el b it: th e w r ite en ab le latch (w el) b it in d i cates th e statu s o f th e in tern al w r ite en ab le latch . bp1, bp0 bits: the block protect (bp1, bp0) bits are non-vol atile. they define the size of the area to be software protected against w r ite instructions. srw d b it: th e statu s reg i ster w r ite disab l e (srw d) b it is o p e rated in co n j u n c tio n with th e write p r o t ect ( w ) si gnal . the st at us r e gi st er w r i t e di sabl e (sr w d) bi t and wri t e prot ect ( w ) sig n a l allo w th e d e v i ce to b e p u t in th e hard ware protected m ode. in this m ode, the non-volatile bits of the status register (srw d, bp1, bp0) becom e read-only bits. instructions each in stru ctio n starts with a sin g l e-b y te co d e , as su m m a rized in th e fo llo win g tab l e. if an in v a lid in stru ctio n is sen t (one not cont ai ned i n t h e fol l o wi ng t a bl e), t h e devi ce aut o m a t i cal l y desel ect s i t s el f. instruction set in stru ctio n d e s c r i p tio n in stru ctio n f o r m a t w r en w r ite enable 0000 0110 w rdi w r ite disable 0000 0100 rdsr read status register 0000 0101 w r sr w r ite status register 0000 0001 read read from memory array 0000 0011 w r it e w r ite to memory array 0000 0010 page 9 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 write enable (wren): the w r ite enable latch (w el) bit m u st be set prior to each w r ite and w r sr inst ruction. the only way to do this is to sen d a w r ite en ab le in stru ctio n to th e d e v i ce. as sh o w n in th e fo llo win g fig u r e, to sen d th is in stru ctio n to th e d e v i ce, chip select ( s ) i s dri v en l o w, and t h e bi t s of t h e i n st ruct i on by t e are shi f t e d i n , on seri al dat a i nput (d). the devi ce t h en en ters a wait state. it waits fo r th e d e vice to be deselected, by chip select ( s ) bei ng dri v en hi gh. write enable (wren) sequence s w c d q instruction 01 2 3 4 5 6 high-z v ih v il v ih v il v ih v il v ih v il 7 page 10 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 write disable (wrdi): on e way o f resettin g th e w r ite en ab le latch (w el) b it is to sen d a w r ite disab l e in stru ctio n to th e d e v i ce. as sh o w n in th e fo llo win g fig u r e, to sen d th is in stru ctio n to th e d e v i ce, ch ip select ( s ) is d r iv en lo w, an d th e b its o f th e in stru ctio n by t e are shi f t e d i n , on seri al dat a i nput (d). the device then enters a wait state. it waits fo r t h e devi ce t o be desel ected, by chip select ( s ) bei ng dri v en hi gh. the w r ite en ab le latch (w el) b it, in fact, b eco m e s reset b y an y o f th e fo llo win g ev en ts: ? ? ? ? s w c d q instruction 1 0 2 3 4 567 high-z v ih v il v ih v il v ih v il v ih v il page 11 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 read status register (rdsr): the read status register (rdsr) instructi on allows the status register to be read . the status register m a y be read at an y tim e, ev en wh ile a w r ite o r w r ite statu s register cycle is in progress. w h en one of these cycles is in progress, it is recom m e nded t o check t h e w r i t e in progress (w ip) bi t before sendi ng a new i n st ruct i on t o t h e devi ce. it i s al so possi bl e t o read t h e st at us r e gi st er cont i nuousl y , as shown i n t h e fol l o wi ng fi gure. read status register (rdsr) sequence s w c d q status register out 01 2 3 4 5 6 7 0 1 2 3 4 5 6 77 8 9 10 11 12 13 14 15 high-z v ih v il v ih v il v ih v il v ih v il the st at us and cont rol bi t s of t h e status register are as follows: w i p b it: th e w r ite in pro g r ess (w ip) b it in d i cates wh eth e r th e m e m o ry is b u s y with a w r ite o r w r ite statu s reg i ster cycle. w h en set to 1, such a cycle is in progress. w h en reset to 0, no such cycles are in progress. w el b it: th e w r ite en ab le latch (w el) b it in d i cates th e statu s o f th e in tern al w r ite en ab le latch . w h en set to 1 , th e in tern al w r ite en ab le latch is set. w h en set to 0 , th e in tern al w r ite en ab le latch is reset an d n o w r ite o r w r ite statu s register instructions are accepted. bp1, bp0 bits: the block protect (bp1, bp0) bits are non-vol atile. they define the size of the area to be software p r o t ected ag ain s t w r ite in stru ctio n s . th ese b its are written with th e w r ite statu s reg i ster (w rsr) in stru ctio n . w h en one or bot h of t h e b l ock prot ect (b p1, b p 0) bi t s are set t o 1, t h e rel e vant m e m o ry area (as defi ned i n t h e st at us register form at table) becom e s protected agai nst w r i t e (w r i te) i n st ruct i ons. the b l ock prot ect (b p1, b p 0) bi t s can b e written p r o v i d e d th at th e hard ware pro t ected m o d e h a s n o t b een set. srw d b it: th e statu s reg i ster w r ite disab l e (srw d) b it is o p e rated in co n j u n c tio n with th e write p r o t ect ( w ) si gnal . the st at us r e gi st er w r i t e di sabl e (sr w d) bi t and wri t e prot ect ( w ) sig n a l allo ws th e d e v i ce to b e p u t in th e hard ware prot ect ed m ode (w hen t h e st at us r e gi st er w r i t e di sabl e (sr w d) bi t i s set t o 1, and wri t e prot ect ( w ) sig n a l is d r iv en low). in this m ode, the non-volatile bits of the status regi ster (srw d, bp1, bp0) becom e read-only bits and the w r ite status register (w rsr) instruction is no longer accepted for execution. page 12 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 write status register (wrsr): th e w r ite statu s reg i ster (w rsr) in stru ctio n allo ws n e w v a lu es to b e written to th e statu s reg i ster. befo re it can b e accepted, a w r ite enable (w ren) instruc tion m u st previously have been execute d. after the w r ite enable (w ren) i n st ruct i on has been decoded and execut e d, t h e devi ce set s th e w r ite en ab le latch ( w el). th e in stru ctio n seq u e n ce is shown i n t h e fol l o wi ng fi gure. the w r i t e st at us r e gi st er (w r s r ) i n st ruct i on has no effect on b6, b5, b4, b1 and b0 of t h e st at us r e gi st er. b6, b5 and b4 are always read as 0. chip select ( s ) m u st be dri v en hi gh aft e r t h e ri si ng edge of serial clo c k (c) th at latch e s in th e eig h t h b it o f th e d a ta by t e , and before t h e next ri si ng edge of seri al cl ock (c ). ot herwi s e, t h e w r i t e st at us r e gi st er (w r s r ) i n st ruct i on i s not execut e d. as soon as chi p sel ect ( s ) i s dri v en hi gh, t h e self-tim ed w r ite statu s reg i st er cycle (whose duration is t w ) is in itiated . w h ile th e w r ite statu s reg i ster cycle is in p r o g r ess, th e statu s reg i ster m a y still b e read to ch eck th e v a lu e o f th e w r ite in pro g r ess (w ip) b it. th e w r ite in pro g r ess (w ip) b it is 1 d u r in g th e self-tim ed w r ite statu s reg i ster cycle, an d is 0 wh en it is co m p leted . w h en th e cycle is co m p leted , w r ite en ab le latch (w el) is reset. th e w r ite statu s reg i ster (w rsr) in stru ctio n allo ws th e u s er t o change t h e val u es of t h e b l ock prot ect (b p1, b p 0) bi t s , t o de fine the size of the area that is to be treated as read-only, as defi ned i n t h e st at us r e gi st er form at t a bl e. th e w r ite statu s reg i ster (w rsr) in stru ctio n also allo ws th e user to set or reset the status register w r ite disable (srw d) bit in accordance w ith the write protect ( w ) si gnal . the st at us r e gi st er w r i t e di sabl e (sr w d) bi t and wri t e prot ect ( w ) si gnal al l o ws t h e devi ce t o be put i n t h e hardware prot ect ed m ode (hpm ). the w r i t e st at us r e gi st er (w rsr) instruction is not executed once the hard ware protected m ode (hpm ) is entered. the contents of the status register w r i t e di sabl e (sr w d) and b l ock prot ect (b p1 , bp0) bits are frozen at their current val u es just before t h e st art of t h e execut i on of t h e w r i t e st at us r e gi st er (w r s r ) i n st ruct i on. the new, updat e d val u es t a ke effect at t h e m o m e nt of com p l e t i on of t h e execut i on of w r i t e st at us r e gi st er (w r s r ) i n st ruct i on. write status register (wrsr) sequence s w c d q status register in msb 01 2 3 4 5 6 7 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 high-z v ih v il v ih v il v ih v il v ih v il page 13 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 read from mem o ry array (read): as sh o w n in th e fo llo win g fig u r e, to sen d th is in stru ctio n to th e d e v i ce, ch ip select ( s ) is first d r iv en lo w. th e b its o f t h e i n st ruct i on by t e and t h e address by t e s are t h en shi f t e d i n , on seri al dat a i nput (d). the addresses are l o aded i n t o an i n t e rnal address regi st er, and t h e by t e of dat a at t h at address i s shi f t e d out , on seri al dat a out put (q). if chip select ( s ) co n tin u e s to b e d r iv en lo w, th e in tern al ad d r ess reg i ster is au to m a tically in crem en ted , an d th e b y te o f dat a at t h e new address i s shi f t e d out . w h en the highest address is reached, the address counter ro lls over to zero, allowing the read cycle to be continued indefinitely. the whole m e m o ry can, therefor e, be read with a single read instruction. the read cycle is term inated by dri v i ng chi p sel ect ( s ) hi gh. the ri si ng edge of t h e chi p sel ect ( s ) signal can occur at any tim e during the cycle. the addressed first byte can be any byte within any page. th e instruction is not accepted, an d is n o t ex ecu ted , if a w r ite cycle is currently in progress. read from memory array (read) sequence s w c d q 16-bit address data out 2 data out 1 01 2 3 4 5 6 7 a0 a1 a2 a3 a13 a14 a15 8 9 10 20 21 22 23 24 25 26 27 28 29 30 31 high-z v ih v il v ih v il v ih v il v ih v il 0 1 2 3 4 5 6 77 instruction note: 1. depending on the memory size, as show n in the fo llow i ng table, the most signi ficant address bits are don?t care. address range bits dev i c e r 1 e x 2 5 0 6 4 a r1ex25032a address bits a12 to a0 a11 to a0 notes: 1. b15-b13 are don?t care on the r1ex25064a 2. b15-b12 are don?t care on the r1ex25032a page 14 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 write to mem o ry array (write): as sh o w n in th e fo llo win g fig u r e, to sen d th is in stru ctio n to th e d e v i ce, ch ip select ( s ) is first d r iv en lo w. th e b its o f t h e i n st ruct i on by t e , address by t e , and at l east one dat a by t e are t h en shi f t e d i n , on seri al dat a i nput (d). th e in stru ctio n is term in ated b y d r iv in g ch ip select ( s ) hi gh at a by t e boundary of t h e i nput dat a . in t h e case of t h e fo llo win g fig u r e, th is o ccu rs after th e eig h t h b it o f th e d a ta b y te h a s b een latch e d in , in d i catin g th at th e in stru ctio n is bei ng used t o wri t e a si ngl e by t e . the sel f-t i m ed w r i t e cy cl e st art s , and cont i nues for a peri od t wc (as specified in ac ch aracteristics). at th e en d o f th e cycle, th e w r ite in pro g r ess (w ip) b it is reset to 0 . if, t hough, chi p sel ect ( s ) cont i nues t o be dri v en l o w, as shown i n t h e fol l o wi ng fi gure, t h e next by t e of t h e i nput dat a i s shi f t e d i n , so t h at m o re t h an a si ngl e by t e , st art i ng from t h e gi ven address t o wards t h e end of t h e sam e page, can be written in a sin g l e in tern al w r ite cycle. each t i m e a new dat a by t e i s shi f t e d i n , t h e l east si gni fi cant bi t s of t h e i n t e rnal address count er are i n crem ent e d. if t h e num ber of data bytes sent to the device exceeds the page boundary, the internal address counter rolls over to the b e g i n n i n g o f th e p a g e , an d th e p r ev io u s d a ta th ere are o v e rwritten with th e in co m i n g d a ta. (th e p a g e size o f th ese devi ce i s 32 by t e s). the instruction is not accepted, and is not executed, under the following conditions: ? ? ? s w c d q 16-bit address data byte 1 01 2 3 4 5 6 7 0 1 2 3 13 14 15 8 9 10 20 21 22 23 24 25 26 27 28 29 30 31 high-z v ih v il v ih v il v ih v il v ih v il 4 5 6 7 0 1 2 3 instruction note: 1. depending on the memory size, as show n in address range bits table, the most significant address bits are don?t care. page 15 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 by te write (write) sequence (page) s w c d q 16-bit address data byte 1 01 2 3 4 5 6 7 0 1 2 3 13 14 15 8 9 10 20 21 22 23 24 25 26 27 28 29 30 31 high-z v ih v il v ih v il v ih v il v ih v il 4 5 6 7 0 1 2 3 instruction s w c d q data byte 3 data byte n 32 33 34 35 36 37 38 39 7 40 41 42 43 44 45 46 47 high-z v ih v il v ih v il v ih v il 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 6 5 4 3 2 1 0 data byte 2 note: 1. depending on the memory size, as show n in address range bits table, the most significant address bits are don?t care. page 16 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 data protect the protection features of the device ar e su m m a rized in th e fo llo win g tab l e. w h en the status register w r ite disable (srw d) b it o f th e statu s reg i ster is 0 (its in itial d e liv ery st ate), it is p o ssib l e to write to th e statu s reg i ster p r o v i d e d th at th e w r ite en ab le latch (w el) b it h a s p r ev io u s ly b een set b y a w r ite en ab le (w ren) in stru ctio n , reg a rd less weat her wri t e prot ect ( w ) i s dri v en hi gh or l o w. w h en the status register w r ite disable (srw d) bit of the stat u s reg i ster is set to 1 , two cases need to be considered, dependi ng on t h e st at e of wri t e prot ect ( w ):  if wri t e prot ect ( w ) is d r iv en h i g h , it is p o ssib l e to write to th e statu s reg i ster p r o v i d e d th at th e w r ite en ab le latch (w el) b it h a s p r ev io u s ly b een set b y a w r ite en ab le (w ren) in stru ctio n .  if wri t e prot ect ( w ) is d r iv en lo w, it is n o t p o ssib l e to write to th e statu s reg i ster ev en if th e w r ite en ab le latch (w el) b it h a s p r ev io u s ly b een set b y a w r ite en ab le (w ren) in stru ctio n . (attem p ts to write to th e statu s register are rejected, and are not accep ted for execution). as a consequence, all the data bytes in the m e m o ry area that are software protected (spm) by t h e b l ock prot ect (b p1, b p 0) bi t s of t h e st at us r e gi st er, are al so hardware prot ect ed agai nst dat a m odi fi cat i on. r e gardl e ss of t h e order of t h e t w o event s , t h e hardware prot ect ed m ode (hpm ) can be ent e red:  by settin g th e statu s reg i ster w r ite disab l e (srw d) b it after d r iv in g write p r o t ect ( w ) low.  b y dri v i ng wri t e prot ect ( w ) lo w after settin g th e statu s reg i ster w r ite disab l e (srw d) b it. th e o n l y way to ex it th e hard ware pro t ected mo d e (hpm) o n ce en tered is to p u ll write p r o t ect ( w ) hi gh. if wri t e prot ect ( w ) i s perm anent l y t i e d hi gh, t h e hardware prot ect ed m ode (hpm ) can never be act i v at ed, and onl y t h e soft ware prot ect ed m ode (spm ), usi ng t h e b l ock prot ect (b p1, b p 0) bi t s of t h e st at us r e gi st er, can be used. write protected block size statu s reg i ster b i ts a rray ad d r esses p r o t ected b p 1 b p 0 pro t ected b l o c k s r1ex25064a r1ex25032a 0 0 n o n e n o n e n o n e 0 1 u p p e r q u a r t e r 1 8 0 0 h ? 1fffh 0c00h ? 0 fffh 1 0 u p p e r h a l f 1 0 0 0 h ? 1fffh 0800h ? 0 fffh 1 1 w h o l e memory 0 0 0 0 h ? 1fffh 0000h ? 0 fffh protection modes memory p r o t e c t w s i gna l srwd bit mode write prote c t ion of the statu s reg i ster pro t ected area * 1 u n p r o t ected area * 1 1 0 softw a r e protected (spm) status register is w r itable (if the wren) instruction has set the w e l bit). t he values in the bp1 and bp0 bits can be changed. w r ite protected ready to accept w r ite instructions 0 0 1 1 0 1 hardw a r e protected (hpm) status register is hardw are w r ite protected. t he values in the bp1 and bp0 bits cannot be changed. w r ite protected ready to accept w r ite instructions note: 1. as defined by the values in the block protected (bp1, bp0) bits of the status register, as show n in the former table. page 17 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 hold condition the hol d ( hold ) signal is used to pause any serial com m unicati ons with the device wit hout resetting the clocking sequence. duri ng t h e hol d condi t i on, t h e seri al dat a out put (q) i s hi gh i m pedance, and seri al dat a i nput (d) and seri al cl ock (c ) are don?t care. to ent e r t h e hol d condi t i on, t h e devi ce m u st be selected, with chip select ( s ) low. norm al l y , t h e devi ce i s kept sel ect ed, for t h e whol e durat i on of t h e hol d condi t i on. desel ect i ng t h e devi ce whi l e i t i s i n t h e hol d condi t i on, has t h e effect of reset t i ng t h e st at e of t h e devi ce, and t h i s m echani s m can be used i f i t i s requi red t o reset any processes t h at had been i n progress. the hol d condi t i on st art s when t h e hol d ( hold ) sig n a l is d r iv en lo w at th e sam e tim e as serial clock (c) already being l o w (as shown i n t h e fol l o wi ng fi gure). the hol d condi t i on ends when t h e hol d ( hold ) sig n a l is d r iv en h i g h at th e sam e tim e as serial clock (c) already being lo w. the fol l o wi ng fi gure al so shows what happens i f t h e ri si ng and fal l i ng edges are not t i m ed t o coincide with serial clock (c ) bei ng l o w. hold condition activ a tion c hold hold status hold status notes data protection at v cc on/off wh e n v cc i s t u rned on or off, noi se on s i nput s generat e d by ext e rnal ci rcui t s (c pu, et c) m a y act as a t r i gger and t u rn t h e eepr o m t o uni nt ent i onal program m ode. to prevent t h i s uni nt ent i onal program m i ng, t h i s eepr o m have a power on reset funct i on. b e careful of t h e not i ces descri bed bel o w i n order for t h e power on reset funct i on t o operat e correctly. ? s shoul d be fi xed t o v cc duri ng v cc on/ off. low t o hi gh or hi gh t o l o w t r ansi t i on duri ng v cc on/ off m a y cause t h e t r i gger for t h e uni nt ent i onal program m i ng. ? ? ? ? page 18 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 package dimensions r1ex25032asa00a/r1ex25064asa00a (prsp0008df-b / previ ous code: fp-8dbv) prsp0008df-b p-sop8-3.9x4.89-1.27 a l e c b d e a b c  x y h z l 2 1 1 e 1 mass[typ.] 0.08g 4.89 1.06 0.25 0 8 6.02 0.15 0.20 0.25 0.45 0.102 0 .14 0.254 3.90 0.406 0 .60 0 .889 1.73 reference symbol dimension in millimeters min n om max previous code jeita package code renesas code fp-8dbv 5.15 1 a p 0.35 0.40 6.20 5.84 1.27 0.10 0.69 index mark e 1 y xm p * 3 * 2 * 1 f 4 85 d e h a z b p terminal cross section ( ni/pd/au plating ) b c detail f 1 1 l l a  note) 1. dimensions" * 1 (nom)"and" * 2" do not include mold flash. 2. dimension" * 3"does not include trim offset. e page 19 of 20
r1ex25032axx00a/r1ex25064axx00a rej03c0358-0002.rev.0. 02 jan.14.2009 page 20 of 20 r1ex25032ata00a/r1ex25064ata00a (ptsp0008jc-b / previous code: ttp-8dav) ptsp0008jc-b p-tssop8-4.4x3-0.65 a l e c b d e a b c  x y h z l 2 1 1 e 1 mass[typ.] 0.034g 3.00 1.00 0.13 0 8 6.40 0.10 0.15 0.20 0.25 0.03 0.07 0.10 4.40 0.40 0.50 0.60 1.10 reference symbol dimension in millimeters min n om max previous code jeita package code renesas code ttp-8dav 3.30 1 a p 0.15 0.20 6.60 6.20 0.65 0.10 0.805 * 1 85 e * 2 index mark 14 * 3 p m x y f a d e h z b detail f 1 1 a l l  p terminal cross section ( ni/pd/au plating ) c b note) 1. dimensions" * 1 (nom)"and" * 2" do not include mold flash. 2. dimension" * 3"does not include trim offset. e
revision history r1ex25032axx00a/r1ex25064axx00a data sheet contents of modification rev. date page description 0.01 jan.25, 2008 ? initial issue 0.02 jan.14, 2009 p1 p3 p4 p5/p6 features endurance cycles change 10 6 cycles to 1,000k cycles @25 c. data retentions years change 10 years to 100 years @25 c. capacitance new is described. memory cell characteristics new is described. dc characteristics output voltage v oh1, v oh2 test conditions change i ol to i oh. ac characteristics erase/write enduranc e is deleted. notes1. change not 100% tested. notes3 deleted.
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in the event of the failure of a renesas product, such as safety design for hardware and software includin g but not limited to redundancy, fire control and malfunction prevention, appropriate treatment for aging degradation or any other applicable measures. among others, sinc e the evaluation of microcomputer software alone is very difficult, please evaluate the safety of the final products or system manufactured by you. 11. in case renesas products listed in this document are detached from the products to which the renesas products are attached or affixed, the risk of accident such as swallowing by infants and small children is very high. you should implement safety measures so that renesas products may not be easily detached from your products. renesas shall have no liability for damages arising out of such detachment. 12. this document may not be reproduced or duplicated, in any form, in whole or in part, without prior written approval from r enesas. 13. please contact a renesas sales office if you have any questions regarding the information contained in this document, renes as semiconductor products, or if you have any other inquiries. sales strategic planning div. nippon bldg., 2-6-2, ohte-machi, chiyoda-ku, tokyo 100-0004, japan http://www.renesas.com refer to " http://www.renesas.com/en/network " for the latest and detailed information. renesas technology america, inc. 450 holger way, san jose, ca 95134-1368, u.s.a tel: <1> (408) 382-7500, fax: <1> (408) 382-7501 renesas technology europe limited dukes meadow, millboard road, bourne end, buckinghamshire, sl8 5fh, u.k. tel: <44> (1628) 585-100, fax: <44> (1628) 585-900 renesas technology (shanghai) co., ltd. unit 204, 205, aziacenter, no.1233 lujiazui ring rd, pudong district, shanghai, china 200120 tel: <86> (21) 5877-1818, fax: <86> (21) 6887-7858/7898 renesas technology hong kong ltd. 7th floor, north tower, world finance centre, harbour city, canton road, tsimshatsui, kowloon, hong kong tel: <852> 2265-6688, fax: <852> 2377-3473 renesas technology taiwan co., ltd. 10th floor, no.99, fushing north road, taipei, taiwan tel: <886> (2) 2715-2888, fax: <886> (2) 3518-3399 renesas technology singapore pte. ltd. 1 harbour front avenue, #06-10, keppel bay tower, singapore 098632 tel: <65> 6213-0200, fax: <65> 6278-8001 renesas technology korea co., ltd. kukje center bldg. 18th fl., 191, 2-ka, hangang-ro, yongsan-ku, seoul 140-702, korea tel: <82> (2) 796-3115, fax: <82> (2) 796-2145 renesas technology malaysia sdn. bhd unit 906, block b, menara amcorp, amcorp trade centre, no.18, jln persiaran barat, 46050 petaling jaya, selangor darul ehsan, m alaysia tel: <603> 7955-9390, fax: <603> 7955-9510 renesas sales offices ? 2008. renesas technology corp., all rights reserved. printed in japan. colophon .7.2


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